Comparison of analog performance in conventional and graded-channel fully-depleted SOI MOSFETs

Pavanello, Marcelo Antonio;Martino, Joao Antonio;Flandre, Denis
(2000) International Conference on Microelectronics and Packaging — Location: Manaus (Brésil) (18.September.2000)

Files

No attached file found for this publication.

Details

Authors
  • Pavanello, Marcelo AntonioEscola Politécnica da Universidade de São Paulo
    Author
  • Martino, Joao AntonioEscola Politécnica da Universidade de São Paulo
    Author
  • Flandre, DenisUCLouvain
    Author
Affiliations

Citations

  • APA
  • Chicago
  • FWB

Pavanello, M. A., Martino, J. A., & Flandre, D. (2000). Comparison of analog performance in conventional and graded-channel fully-depleted SOI MOSFETs. Proceedings of the International Conference on Microelectronics and Packaging, 67-71. https://hdl.handle.net/2078.5/252753