Evidence for Substrate Bias effects in SOI ΩFETs

Rudenko, Ramara;Kilchytska, Valeriya;Collaert, N.;Jurczak, Malgorzata;Flandre, Denis;et.al.
(2008) 2008 EUROSOI Conference — Location: Cork (Ireland) (23.January.2008)

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  • Rudenko, RamaraLashkarov Institute of Semiconductor Physics, Kiev
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  • Kilchytska, ValeriyaUCLouvain
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  • Collaert, N.IMEC, Leuven
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  • Jurczak, MalgorzataUkraine national Academy of Science
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  • Flandre, DenisUCLouvain
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Rudenko, R., Kilchytska, V., Collaert, N., Jurczak, M., Nazarov, A., & Flandre, D. (2008). Evidence for Substrate Bias effects in SOI ΩFETs. Proceedings of the 2008 EUROSOI Conference, 137-138. https://hdl.handle.net/2078.5/252747