High Temperature Characterization of Carrier Generation in SOI MOS Devices Using Gated-Diode Technique

Rudenko, Tamara;Kilchytska, Valeriya;Flandre, Denis;Dessard, Vincent
(2001) HITEN′2001 - International Conference on High Temperature Electronic — Location: Oslo (Norway) (5.June.2001)

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Rudenko, T., Kilchytska, V., Flandre, D., & Dessard, V. (2001). High Temperature Characterization of Carrier Generation in SOI MOS Devices Using Gated-Diode Technique. Proceedings of HITEN′2001 - International Conference on High Temperature Electronic. HITEN′2001 - International Conference on High Temperature Electronic, Oslo (Norway). https://hdl.handle.net/2078.5/252737