SOI n-MOSFET low-frequency noise from full to partial depletion: measurements, modeling and implications for analog designs
(2001) 2001 IEEE International SOI Conference — Location: Durango(USA) (2.October.2001)
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Dessard, V., Adriaensen, S., & Flandre, D. (2001). SOI n-MOSFET low-frequency noise from full to partial depletion: measurements, modeling and implications for analog designs. Proceedings of the 2001 IEEE International SOI Conference. 2001 IEEE International SOI Conference, Durango(USA). https://hdl.handle.net/2078.5/252715