Parasitic bipolar effects in graded-channel fully-depleted Silicon-on-Insulator nMOSFETs

Pavanello, Marcelo Antonio;Martino, Joao Antonio;Flandre, Denis
(2000) International Conference on Microelectronics and Packaging — Location: Manaus (Brésil) (18.September.2000)

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  • Pavanello, Marcelo AntonioEscola Politécnica da Universidade de São Paulo
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  • Martino, Joao AntonioCentro de Investigacion y Estudios Avazandos del IPN
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  • Flandre, DenisUCLouvain
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Pavanello, M. A., Martino, J. A., & Flandre, D. (2000). Parasitic bipolar effects in graded-channel fully-depleted Silicon-on-Insulator nMOSFETs. Proceedings of the International Conference on Microelectronics and Packaging, 97-102. https://hdl.handle.net/2078.5/252710