Electrical characterization of an industrial SOS-CMOS process up to 300°C
(2002) 6th High Temperature Electronics Conference (HITEC) — Location: Albuquerque (USA) (2.June.2002)
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Vancaillie, L., Kilchytska, V., Levacq, D., Dessard, V., Demeûs, L., & Flandre, D. (2002). Electrical characterization of an industrial SOS-CMOS process up to 300°C. Proceedings of the 6th High Temperature Electronics Conference (HITEC), 10-17. https://hdl.handle.net/2078.5/252697