Self-Cascode SOI versus Graded-Channel SOI MOS Transistors for Low-Voltage Applications
(2003) European Conference on Circuit Theory and Design (ECCTD′03) — Location: Cracow (Poland) (1.September.2003)
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Sanz, M. T., Celma, S., Calvo, B., & Flandre, D. (2003). Self-Cascode SOI versus Graded-Channel SOI MOS Transistors for Low-Voltage Applications. Proceedings of the European Conference on Circuit Theory and Design (ECCTD′03), I-157 to I-160. https://hdl.handle.net/2078.5/252628