Charge Sensitive Amplifier Study in 2μm FD SOI CMOS
(2011) IEEE International SOI Conference (SOI 2011) — Location: Tempe (USA) (3.October.2011)
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Soung Yee, L., Martin, E., Cortina Gil, E., Renaux, C., & Flandre, D. (2011). Charge Sensitive Amplifier Study in 2μm FD SOI CMOS. Proceedings of the IEEE International SOI Conference (SOI 2011). IEEE International SOI Conference (SOI 2011), Tempe (USA). https://doi.org/10.1109/SOI.2011.6081694