A simple leakage drain current model for accumulation-mode SOI nMOSFETs operating up to 300°C

Bellodi, Marcello;Iniguez, Benjamin;Flandre, Denis;Martino, J.A.

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  • Bellodi, MarcelloUniversidade de Sao Paulo
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  • Iniguez, BenjaminUCLouvain
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  • Flandre, DenisUCLouvain
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  • Martino, J.A.Centro Universitario da FEI
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