Characterization of thin-film SOI split-drain MOS transistors as magnetic sensors
(2001) Tenth International Symposium on Silicon-on-Insulator Technology and Devices — Location: Washington, DC (USA) (25.March.2001)
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Picun, G., & Flandre, D. (2001). Characterization of thin-film SOI split-drain MOS transistors as magnetic sensors. Electrochemical Society. Proceedings, 2001(3), 289-294. https://hdl.handle.net/2078.5/252441 (Original work published 2001)