TEM characterization of twinned nanocrystalline palladium thin films
(2010) 2010 Materials Research Society Fall Meeting - MRS Fall′10 — Location: Boston, MA, USA (29.November.2010)
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Idrissi, H., Wang, B., Colla, M.-S., Raskin, J.-P., Schrijvers, D., & Pardoen, T. (2010). TEM characterization of twinned nanocrystalline palladium thin films. Proceedings of the 2010 Materials Research Society Fall Meeting, p. paper # P1.3. https://hdl.handle.net/2078.5/236836