TEM characterization of freestanding Pd and Al films for lab-on-chip nanomechanical tensile testing
(2010) MICROSCIENCE 2010 — Location: London, UK (29.June.2010)
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Schrijvers, D., Idrissi, H., Wang, B., Colla, M.-S., Coulombier, M., Boe, A., Proost, J., Raskin, J.-P., & Pardoen, T. (2010). TEM characterization of freestanding Pd and Al films for lab-on-chip nanomechanical tensile testing. Proceedings of the MICROSCIENCE 2010, p. paper M3.2 - 0062. https://hdl.handle.net/2078.5/236835