In-situ characterization of the time dependent mechanical properties of nanocrystalline Pd thin filmsColla, Marie-Stéphane;Amin-Ahmadi, B.;Pardoen, Thomas;Idrissi, Hosni;Raskin, Jean-Pierre;et.al.(2013) MECANO — Location: Dusseldorf, Germany (18.July.2013)
FilesNo attached file found for this publication.DetailsAuthorsColla, Marie-StéphaneUCLouvainAuthorAmin-Ahmadi, B.UCLouvainAuthorPardoen, ThomasUCLouvainAuthorIdrissi, HosniUCLouvainAuthorRaskin, Jean-PierreUCLouvainAuthorShow more AffiliationsUCLouvainSST/IMMC/IMAP - Materials and process engineeringUCLouvainSST/ICTM/ELEN - Pôle en ingénierie électriqueShow moreCitations APA Chicago FWB Colla, M.-S., Amin-Ahmadi, B., Pardoen, T., Idrissi, H., Malet, L., Schryvers, D., Godet, S., & Raskin, J.-P. (2013). In-situ characterization of the time dependent mechanical properties of nanocrystalline Pd thin films. MECANO, Dusseldorf, Germany. https://hdl.handle.net/2078.5/236812