Pardoen, T., Colla, M.-S., Coulombier, M., Wang, B., Idrissi, H., Schryvers, D., & Raskin, J.-P. (2014). Failure in thin metallic films: on chip testing and size effects. 20th European Conference on Fracture, Trondheim, Norvège. https://hdl.handle.net/2078.5/236803