Dislocation mediated hardening and relaxation in nanocrystalline palladium films revealed by on-chip HRTEM time-resolved nano mechanical testing.Amin-Ahmadi, B.;Colla, Marie-Stéphane;Idrissi, Hosni;Malet, Loïc;Schryvers, Dominique;et.al.(2015) MMC 2015 — Location: Manchester Central, UK (29.June.2015)
FilesNo attached file found for this publication.DetailsAuthorsAmin-Ahmadi, B.EMAT, University of Antwerp, BelgiumAuthorColla, Marie-StéphaneUCLouvainAuthorIdrissi, HosniUCLouvainAuthorMalet, LoïcUniversité Libre de Bruxelles, BelgiqueAuthorRaskin, Jean-PierreUCLouvainAuthorPardoen, ThomasUCLouvainAuthorSchryvers, DominiqueUniversity of Antwerp, BelgiumAuthorShow more AffiliationsUCLouvainSST/ICTM/ELEN - Pôle en ingénierie électriqueUCLouvainSST/IMMC/IMAP - Materials and process engineeringShow moreCitations APA Chicago FWB Amin-Ahmadi, B., Colla, M.-S., Idrissi, H., Malet, L., Godet, S., Raskin, J.-P., Pardoen, T., & Schryvers, D. (2015). Dislocation mediated hardening and relaxation in nanocrystalline palladium films revealed by on-chip HRTEM time-resolved nano mechanical testing. Proceedings of the MMC 2015. Published. MMC 2015, Manchester Central, UK. https://hdl.handle.net/2078.5/236801