Study of creep/relaxation in nanocrystalline FCC thin films through internal-stress-actuated microtensile testing method

Lemoine, Guerric;Colla, Marie-Stéphane;Amin-Ahmadi, B.;Idrissi, Hosni;Delannay, Laurent;et.al.
(2015) 13th International Conference on Creep and Fracture of Engineering Materials and Structures - CREEP2015 — Location: Toulouse (31.May.2015)

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Abstract
Thin films ("thin" meaning thinner than μ1m) are nowadays present everywhere such as in MEMS, solar cells and protective or functional coatings. The mechanical integrity of the films is the key for the reliability of the devices under interest. Compared to their bulk counterparts, thin films involve, owing to the very fine microstructure, moderate to high strain rate sensitivity, which can lead to detrimental creep.....
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Lemoine, G., Colla, M.-S., Amin-Ahmadi, B., Idrissi, H., Schryvers, D., Raskin, J.-P., Pardoen, T., & Delannay, L. (2015). Study of creep/relaxation in nanocrystalline FCC thin films through internal-stress-actuated microtensile testing method. 13th International Conference on Creep and Fracture of Engineering Materials and Structures - CREEP2015, Toulouse. https://hdl.handle.net/2078.5/236798