Improving the determination of strain in the deformed Silicon measured by Raman spectroscopy
(2023) International Meeting on Optical Measurement Techniques and Industrial Applications — Location: Delft (Netherlands) (28.March.2023)
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- Authors
Roisin, Nicolas 
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Citations
Francis, L., Roisin, N., Colla, M.-S., Flandre, D., & Raskin, J.-P. (2023). Improving the determination of strain in the deformed Silicon measured by Raman spectroscopy. International Meeting on Optical Measurement Techniques and Industrial Applications. Published. International Meeting on Optical Measurement Techniques and Industrial Applications, Delft (Netherlands). https://hdl.handle.net/2078.5/236783