High-resolution microfocus X-ray computed tomography for 3D surface roughness measurements of additive manufactured porous materials

Kerckhofs, Greet; Pyka, Grzegorz; Moesen, Maarten; Van Bael, Simon; Schrooten, Jan; Wevers, Martine

doi:10.1002/adem.201200156

High-resolution microfocus X-ray computed tomography for 3D surface roughness measurements of additive manufactured porous materials

Kerckhofs, Greet

;

Pyka, Grzegorz

;

Moesen, Maarten

;

Van Bael, Simon

;

Wevers, Martine

;et.al.

(2013) Advanced Engineering Materials — Vol. 15, n° 3, p. 153-158 (2013)

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Kerckhofs, GreetUCLouvain
Author
Pyka, Grzegorz
Author
Moesen, Maarten
Author
Van Bael, Simon
Author
Wevers, Martine
Author

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Kerckhofs, G., Pyka, G., Moesen, M., Van Bael, S., Schrooten, J., & Wevers, M. (2013). High-resolution microfocus X-ray computed tomography for 3D surface roughness measurements of additive manufactured porous materials. Advanced Engineering Materials, 15(3), 153-158. https://doi.org/10.1002/adem.201200156 (Original work published 2013)