Assessing Carrier Mobility, Dopability, and Defect Tolerance in the Chalcogenide Perovskite Ba⁢Zr⁢S3

Yuan, Zhenkun;Dahliah, Diana;Claes, Romain;Pike, Andrew;Hautier, Geoffroy;et.al.
(2024) PRX Energy — Vol. 3, n° 3, p. 33008 (2024)

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Authors
  • Yuan, ZhenkunThayer School of Engineering, Dartmouth College, Hanover, New Hampshire 03755, USA
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  • Dahliah, DianaDepartment of Physics, An-Najah National University, Nablus, Palestine
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  • Claes, RomainUCLouvain
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  • Pike, AndrewThayer School of Engineering, Dartmouth College, Hanover, New Hampshire 03755, USA
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  • Hautier, GeoffroyThayer School of Engineering, Dartmouth College, Hanover, New Hampshire 03755, USA
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Abstract
The chalcogenide perovskite Ba⁢Zr⁢S3 has attracted much attention as a promising solar absorber for thin-film photovoltaics. Here we use first-principles calculations to evaluate its carrier transport and defect properties. We find that Ba⁢Zr⁢S3 has a phonon-limited electron mobility of 37cm2/V s, which is comparable to that in halide perovskites, but lower hole mobility of 11cm2/V s. The defect computations indicate that Ba⁢Zr⁢S3 is intrinsically 𝑛-type due to shallow sulfur vacancies, but that strong compensation by sulfur vacancies will prevent attempts to make it 𝑝-type. We also establish that Ba⁢Zr⁢S3 shows some degree of defect tolerance, presenting only few low formation energy, deep intrinsic defects. Among the deep defects, sulfur interstitials are the dominant nonradiative recombination centers but exhibit a moderate capture coefficient. Our work highlights the material’s intrinsic limitations in carrier mobility and 𝑝-type doping, and suggests focusing on suppressing the formation of sulfur interstitials to achieve longer carrier lifetime.
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Citations

Yuan, Z., Dahliah, D., Claes, R., Pike, A., Fenning, D. P., Rignanese, G.-M., & Hautier, G. (2024). Assessing Carrier Mobility, Dopability, and Defect Tolerance in the Chalcogenide Perovskite Ba⁢Zr⁢S3. PRX Energy, 3(3), 33008. https://doi.org/10.1103/PRXEnergy.3.033008 (Original work published 2024)