Sub-10-nm Nanogap Fabrication by Silicidation

Tang, Xiaohui;Francis, Laurent;Dutu, Constantin Augustin;Reckinger, Nicolas;Raskin, Jean-Pierre
(2013) 13th IEEE International Conference on Nanotechnology 2013 — Location: Beijing (China) (5.August.2013)

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Authors
  • Tang, XiaohuiUCLouvain
    Author
  • Author
  • Dutu, Constantin AugustinUCLouvain
    Author
  • Reckinger, NicolasResearch Center in Physics of Matter and Radiation, University of Namur
    Author
  • Author
Abstract
We developed a simple and reliable method for the fabrication of sub-10-nm wide nanogaps. The self-formed nanogap is based on the stoichiometric solid-state reaction between metal and Si atoms during silicidation. The nanogap width is determined by the metal layer thickness. Our proposed method provides nanogaps with either symmetric or asymmetric electrodes, as well as multiple nanogaps within one unique process step. Therefore, this method allows for high throughput and large-scale production.
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Citations

Tang, X., Francis, L., Dutu, C. A., Reckinger, N., & Raskin, J.-P. (2013). Sub-10-nm Nanogap Fabrication by Silicidation. Proceedings of the 13th IEEE International Conference on Nanotechnology 2013, p. 570-573. https://doi.org/10.1109/NANO.2013.6720811