Size effect on the elastic modulus of nanomaterials as measured by resonant contact atomic force microscopy
(2003) NanoTech 2003, Nanotechnology Conference and Trade show — Location: San Francisco, CA, USA (23.February.2003)
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- Abstract
- The elastic modulus of metallic (Ag and Pb) nanowires and polymer (polypyrrole, PPy) nanotubes was measured using a novel method, resonant contact atomic force microscopy (resonant C-AFM). The cantilever vibration is excited with an electric field applied between the sample holder and the AFM head. The resonance frequency of the cantilever in contact with the sample shifts to higher values compared to the free resonance frequency. Its value depends on the stiffness of the tip-sample contact. It is shown that this method enables to quantitatively measure the Young's modulus of nanotubes or nanowires. The obtained results are discussed in terms of an effect of the reduced size on the measured elastic modulus.
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Citations
Cuenot, S., Demoustier, S., Fretigny, C., & Nysten, B. (2003). Size effect on the elastic modulus of nanomaterials as measured by resonant contact atomic force microscopy. In Laudon, M.; Romanowicz, B.; (ed.), 2003 Nanotechnology Conference and Trade Show. Nanotech 2003. Nanotech2003 Joint Meeting. 6th International Conference on Modeling andSimulation of Microsystems, MSM 2003. 3rd International Conference onComputational Nanoscience and Technology, ICCN 2003. 2003 Workshop onCompact Modeling, WCM 2003 (p. Vol. 3, p. 549-52). Computational publications. https://hdl.handle.net/2078.5/230987