A new nanomechanical testing concept for thin filmsPardoen, Thomas;Coulombier, Michaël;Safi, A.;Boé, A.;Raskin, Jean-Pierre(2008) Gordon Conference on thin films — Location: Colby College, Maine USA
FilesNo attached file found for this publication.DetailsAuthorsPardoen, ThomasUCLouvainAuthorCoulombier, MichaëlUCLouvainAuthorSafi, A.AuthorBoé, A.AuthorRaskin, Jean-PierreUCLouvainAuthorAffiliationsUCLouvainFSA/MAPR - Département des sciences des matériaux et des procédésUCLouvainFSA/ELEC - Département d'électricitéShow moreCitations APA Chicago FWB Pardoen, T., Coulombier, M., Safi, A., Boé, A., & Raskin, J.-P. (2008). A new nanomechanical testing concept for thin films. Gordon Conference on thin films, Colby College, Maine USA. https://hdl.handle.net/2078.5/230776