TEM study of the NiTi shape memory thin film

Wang, B.;Safi, A.;Pardoen, Thomas;Boé, A.;Schryvers, D.;et.al.
(2008) 14th European Microscoyp Congress EMC′08 — Location: Aachen, Germany (1.September.2008)

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Wang, B., Safi, A., Pardoen, T., Boé, A., Raskin, J.-P., Wang, X., Vlassak, J., & Schryvers, D. (2008). TEM study of the NiTi shape memory thin film. Proceedings of the 14th European Microscoyp Congress EMC′08, p. paper # P659. https://hdl.handle.net/2078.5/230708