Wang, B., Safi, A., Pardoen, T., Boé, A., Raskin, J.-P., Wang, X., Vlassak, J., & Schryvers, D. (2008). TEM study of the NiTi shape memory thin film. Proceedings of the 14th European Microscoyp Congress EMC′08, p. paper # P659. https://hdl.handle.net/2078.5/230708