Coulombier, M., Ryelandt, L., Idrissi, H., Wang, B., Schrijvers, D., Raskin, J.-P., & Pardoen, T. (2011). Deformation mechanisms in aluminium and aluminium-silicon freestanding thin films uncovered through on-chip testing. Proceedings of the European Congress on Advanced Materials and Processes – EuroMAT 2011, p. Session In-situ Testing 2, paper # 5. https://hdl.handle.net/2078.5/230670