Steady-state measurement and modelling of wafer bonding failure resistance
(2002) 16th European Conference on Solid-State Transducers — Location: Prague, Czech Republic (15.September.2002)
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Bertholet, Y., Iker, F., Raskin, J.-P., & Pardoen, T. (2002). Steady-state measurement and modelling of wafer bonding failure resistance. Proceedings of the 16th European Conference on Solid-State Transducers, p. 1 page. https://hdl.handle.net/2078.5/230605