Lab on-chip for testing thin film materials: extraction of mechanical properties at the nanometer scale
(2016) Belgian Physical Society Meeting — Location: Ghent (Belgium) (18.May.2016)
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Lemoine, Guerric 
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Coulombier, M., Favache, A., Idrissi, H., Lemoine, G., Tuyaerts, R., van der Rest, A., Hammad, M., Ureña Begara, F., Pardoen, T., & Raskin, J.-P. (2016). Lab on-chip for testing thin film materials: extraction of mechanical properties at the nanometer scale. Belgian Physical Society Meeting, paper #62. https://hdl.handle.net/2078.5/228480