High-temperature low-frequency noise measurements in thin-film SOI n-MOSFETs

Dessard, Vincent;Flandre, Denis
(1997) Conference HITEN 1997 — Location: Manchester (UK) (15.September.1997)

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Dessard, V., & Flandre, D. (1997). High-temperature low-frequency noise measurements in thin-film SOI n-MOSFETs. Proceedings of HITEN 1997, 139-144. https://hdl.handle.net/2078.5/225914