Defect Engineering in n‐Type Oxide Semiconductor TFTs

Li, Guoli;He, Jiawei;Flandre, Denis;Liao, Lei
(2021) International Conference on Display Technology 2021 (ICDT 2021) — Location: Beijing (China) (30.May.2021)

Files

DefectEngineeringinnTypeOxideSemiconductorTFTs.html
  • Open Access
  • HTML
  • 20.38 KB
Download

Details

Authors
  • Li, GuoliSchool of Physics and Electronics, Hunan University, Changsha, China
    Author
  • He, JiaweiSchool of Physics and Technology, Wuhan University, Wuhan, China
    Author
  • Flandre, Denisorcid-logoUCLouvain
    Author
  • Liao, LeiSchool of Physics and Electronics, Hunan University, Changsha, China
    Author
Affiliations

Citations

  • APA
  • Chicago
  • FWB

Li, G., He, J., Flandre, D., & Liao, L. (2021). Defect Engineering in n‐Type Oxide Semiconductor TFTs. International Conference on Display Technology 2021 (ICDT 2021), Beijing (China). https://hdl.handle.net/2078.5/224280