Imperfection-sensitive ductility of aluminium thin films
(2010) Scripta Materialia — Vol. 62, n° 10, p. 742-745 (2010)
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- Abstract
- Ductility, defined as the strain at the onset of necking, has been characterized in thin Al films using an on-chip, internal stress actuated, microtensile testing setup. In the smallest specimens, the ductility is equal to 0.08 and 0.27 for 200 and 375 nm thick films, respectively, while the average strain-hardening exponents are, respectively, equal to 0.11 and 0.23. In addition to the thickness effect, ductility decreases with increasing specimen size due to imperfection sensitivity, involving a size-dependent statistical behaviour. (C) 2010 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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Citations
Coulombier, M., Boe, A., Brugger, C., Raskin, J.-P., & Pardoen, T. (2010). Imperfection-sensitive ductility of aluminium thin films. Scripta Materialia, 62(10), 742-745. https://doi.org/10.1016/j.scriptamat.2010.01.048 (Original work published 2010)