Secondary molecular ion emission in static SIMS of organic materials

Bertrand, Patrick;Delcorte, Arnaud
(1997) 11th International Conference on Secondary Ion Mass Spectrometry — Location: Orlando (U.S.A.) (September.1997)

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Bertrand, P., & Delcorte, A. (1997). Secondary molecular ion emission in static SIMS of organic materials. 11th International Conference on Secondary Ion Mass Spectrometry, Orlando (U.S.A.). https://hdl.handle.net/2078.5/206562