Scattering gate interferometry at a quantum point contact” 20th International Conference on Electronic Properties of Two-Dimensional Systems

Brun, B.;Rodrigues Martins, Frederico;Faniel, Sébastien;Hackens, Benoît;Sellier, H.;et.al.
(2013) 20th International Conference on Electronic Properties of Two-Dimensional Systems (EP2DS-20) — Location: Wroclaw, Poland

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  • Brun, B.
    Author
  • Rodrigues Martins, FredericoUCLouvain
    Author
  • Faniel, SébastienUCLouvain
    Author
  • Hackens, BenoîtUCLouvain
    Author
  • Bayot, VincentUCLouvain
    Author
  • Huant, S.UCLouvain
    Author
  • Gennser, U.UCLouvain
    Author
  • Mailly, D.UCLouvain
    Author
  • Sanquer, M.UCLouvain
    Author
  • Sellier, H.UCLouvain
    Author
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Brun, B., Rodrigues Martins, F., Faniel, S., Hackens, B., Bayot, V., Huant, S., Gennser, U., Mailly, D., Sanquer, M., & Sellier, H. (2013). Scattering gate interferometry at a quantum point contact” 20th International Conference on Electronic Properties of Two-Dimensional Systems. 20th International Conference on Electronic Properties of Two-Dimensional Systems (EP2DS-20), Wroclaw, Poland. https://hdl.handle.net/2078.5/200763