Chemical Analysis of Plasma-treated Organic Surfaces and Plasma Polymers by Secondary Ion Mass Spectrometry
(2015) Plasma Processes and Polymers — Vol. 12, n° 9, p. 905-918 (2015)
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- Abstract
- This feature article is focused on the application of secondary ion mass spectrometry (time-offlight SIMS) to the chemical and structural study of plasma-treated organic surfaces and plasma polymer films. After a brief historical perspective and a presentation of the recent developments of SIMS, illustrative case studies involving plasma-treated polymer surfaces and plasma polymers are presented. Beyond surface analysis by static SIMS, we show the potential of molecular depth-profiling by low-energy Csþ ions and large Arn þ clusters for the in-depth chemical characterization of plasma-modified samples. Together with SIMS data processing by multivariate analysis, molecular depth-profiling could provide a step change for the analysis of films treated or polymerized with plasmas.
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Citations
Delcorte, A., Cristaudo, V., Zarshenas, M., Merche, D., Reniers, F., & Bertrand, P. (2015). Chemical Analysis of Plasma-treated Organic Surfaces and Plasma Polymers by Secondary Ion Mass Spectrometry. Plasma Processes and Polymers, 12(9), 905-918. https://doi.org/10.1002/ppap.201500061 (Original work published 2015)