Imaging and tuning electron transport inside nanodevices

Toussaint, Sébastien; Brun-Barrière, Boris; Cabosart, Damien; Felten, A.; Reckinger, Nicolas; Iordanescu, Andra-Gabriela; Martins, Federico; Faniel, Sébastien; Pala, Marco; Wallart, X.; Desplanque, L.; Sellier, H.; Huant, S.; Bayot, Vincent; Hackens, Benoît

Imaging and tuning electron transport inside nanodevices

Toussaint, Sébastien

;

Brun-Barrière, Boris

;

Cabosart, Damien

;

Felten, A.

;

Hackens, Benoît

;et.al.

(2017) 20e Forum des microscopies à sondes locales — Location: Juvignac (20.March.2017)

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Toussaint, SébastienUCLouvain
Author
Brun-Barrière, BorisUCLouvain
Author
Cabosart, Damien
Author
Felten, A.
Author
Reckinger, NicolasUCLouvain
Author
Iordanescu, Andra-GabrielaUCLouvain
Author
Faniel, SébastienUCLouvain
Author
Bayot, VincentUCLouvain
Author
Hackens, BenoîtUCLouvain
Author

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Toussaint, S., Brun-Barrière, B., Cabosart, D., Felten, A., Reckinger, N., Iordanescu, A.-G., Martins, F., Faniel, S., Pala, M., Wallart, X., Desplanque, L., Sellier, H., Huant, S., Bayot, V., & Hackens, B. (2017). Imaging and tuning electron transport inside nanodevices. -. Published. 20e Forum des microscopies à sondes locales, Juvignac. https://hdl.handle.net/2078.5/174889 (Original work published 2017)