Accurate characterization of tip-induced potential using electron interferometry
(2020) Applied Physics Letters — Vol. 117, n° 19, p. 193101 (2020)
Files
Andra_APL20_published.pdf
Open Access - Adobe PDF
- 1.91 MB
Details
- Authors
Brun-Barrière, Boris 
- Affiliations
Citations
Iordanescu, A.-G., Toussaint, S., Bachelier, G., Fallahi, S., Gardner, C. G., Manfra, M. J., Hackens, B., & Brun-Barrière, B. (2020). Accurate characterization of tip-induced potential using electron interferometry. Applied Physics Letters, 117(19), 193101. https://doi.org/10.1063/5.0023698 (Original work published 2020)