C-60 molecular depth profiling of bilayered polymer films using ToF-SIMS

Mouhib, Taoufiq;Bertrand, Patrick;Poleunis, Claude;Delcorte, Arnaud
(2011) Surface and Interface Analysis — Vol. 43, n° 1-2, p. 175-178 (2011)

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Mouhib, T., Bertrand, P., Poleunis, C., & Delcorte, A. (2011). C-60 molecular depth profiling of bilayered polymer films using ToF-SIMS. Surface and Interface Analysis, 43(1-2), 175-178. https://doi.org/10.1002/sia.3539 (Original work published 2011)