Imposing and determining stress in sub-micron samples
(2008)
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- Abstract
- This invention provides a method and device for imposing and determining mechanical stress and/or strain, on micro-scale and nano-scale beams, films or multi-layers of materials such as metallic materials, polymer materials, ceramic materials, carbon-based materials and silicon-based materials using a set of micro- or nano-machines. The present invention also provides methods to derive and modify various properties or state of such nano- or microstructures, among others mechanical properties, and to measure the external stimulus that they are subjected to.
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Citations
Pardoen, T., Raskin, J.-P., Carbonnelle, P., & Gravier, S. (2008). Imposing and determining stress in sub-micron samples (Patent No. PCT/EP2008/051810). https://hdl.handle.net/2078.5/153772