Study of Matching Properties of Graded-Channel SOI MOSFETs
(2008) Journal of Integrated Circuits and Systems — Vol. 3, n° 2, p. 69-75 (2008)
Files
No attached file found for this publication.
Details
- Authors
- Affiliations
Centro Universitário da FEI, São Bernardo do Campo, SP, Brazil Electrical Engineering Department
Citations
de Souza, M., Flandre, D., & Pavanello, M. (2008). Study of Matching Properties of Graded-Channel SOI MOSFETs. Journal of Integrated Circuits and Systems, 3(2), 69-75. https://hdl.handle.net/2078.5/151907 (Original work published 2008)