Characterization of a two-layer aquifer using well drawdown dataVanclooster, Marnik;Frippiat, Christophe;Holeyman, Alain;Peeters, Gérard(2009) AGU Fall Meeting — Location: San Francisco, USA
FilesNo attached file found for this publication.DetailsAuthorsVanclooster, MarnikUCLouvainAuthorFrippiat, ChristopheUCLouvainAuthorHoleyman, AlainUCLouvainAuthorPeeters, GérardUCLouvainAuthorAffiliationsUCLouvainAGRO/MILA - Département des sciences du milieu et de l'aménagement du territoireUCLouvainFSA/AUCE - Département d'architecture, d'urbanisme et de génie civil environnementalUCLouvainAC/ADPI - Administration du patrimoine immobilier et des infrastructuresShow moreCitations APA Chicago FWB Vanclooster, M., Frippiat, C., Holeyman, A., & Peeters, G. (2009). Characterization of a two-layer aquifer using well drawdown data. Book of abstracts, p. H21C-0863. https://hdl.handle.net/2078.5/150299