Secondary molecular emission in static SIMS of organic materials

Bertrand, Patrick;Delcorte, Arnaud
(1998) Secondary Ion Mass Spectrometry: SIMS XI — ISBN: [0-471-97826-4], p. 437-442, published

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Bertrand, P., & Delcorte, A. (1998). Secondary molecular emission in static SIMS of organic materials. In G. Gillen, R. Lareau, J. Bennett, F. Stevie (ed.), Secondary Ion Mass Spectrometry: SIMS XI (p. p. 437-442). John Wiley & Sons. https://hdl.handle.net/2078.5/149632