How do large organic molecules sputter? Insights from TOF-SIMS and molecular dynamics simulations

Delcorte, Arnaud;Bertrand, Patrick;Vickerman, J.C.;Garrison, B.J.
(2000) Secondary Ion Mass Spectrometry, SIMS XII — ISBN: [0-444-50323-4], p. 27-32, published

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  • Bertrand, PatrickUCLouvain
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  • Vickerman, J.C.
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  • Garrison, B.J.
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Delcorte, A., Bertrand, P., Vickerman, J. C., & Garrison, B. J. (2000). How do large organic molecules sputter? Insights from TOF-SIMS and molecular dynamics simulations. In A. Benninghoven, P. Bertrand, H.-N. Migeon and H. Werner (ed.), Secondary Ion Mass Spectrometry, SIMS XII (p. p. 27-32). Elsevier Science Publ. https://hdl.handle.net/2078.5/149600