C-60 SIMS depth profiling of bovine serum albumin protein-coating films: a conformational study
(2010) Surface and Interface Analysis — Vol. 42, n° 6-7, p. 641-644 (2010)
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- Characterisation of the protein films has been a subject of long-standing interest in biomaterials research. With the advent of polyatomic ion beams such as C-60, Time-of-Flight-SIMS (ToF-SIMS) depth profiling analysis is now able to provide information about the protein-substrate interface chemistry. To investigate this effect, two types of films, bovine serum albumin (BSA) onto hydrophilic silicon wafer, and BSA onto hydrophobic silanized silicon were fabricated using the dried-droplet procedure. Depth profiling experiments were conducted in a ToF-SIMS instrument equipped with C-60(+) and Ga+ ion sources (sputtering ion, 15 keV C-60(+); analysis ion, 12 keV Ga+). The molecular information is kept during the protein film depth profiling for both films. Principal component analysis (PCA) was used to determine the relative changes in the spectra recorded during the depth profiling. Spectral differences identified using PCA were correlated to conformational changes of the protein that occurred during drying according to the substrate properties. Copyright (C) 2010 John Wiley & Sons, Ltd.
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Mouhib, T., Delcorte, A., Poleunis, C., Henry, M., & Bertrand, P. (2010). C-60 SIMS depth profiling of bovine serum albumin protein-coating films: a conformational study. Surface and Interface Analysis, 42(6-7), 641-644. https://doi.org/10.1002/sia.3349 (Original work published 2010)