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Resonant contact-AFM measurement of the elastic properties of nanomaterials.

Cuenot, Stéphane;Fretigny, Christian;Demoustier, Sophie;Nysten, Bernard
(2002) 224th American Chemical Society National Meeting — Location: Boston, MA, USA (18.August.2002)

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Cuenot, S., Fretigny, C., Demoustier, S., & Nysten, B. (2002). Resonant contact-AFM measurement of the elastic properties of nanomaterials. American Chemical Society. Abstracts of Papers (at the National Meeting), 224, U405-U406. https://hdl.handle.net/2078.5/141944 (Original work published 2002)