New method to detect very low levels of long chain branching in high density polyethylene.

Bailly, Christian;Stephenne, Vincent;Daoust, Daniel;Godard, Pierre;Keunings, Roland;et.al.
(2003) 226th National Meeting of the American-Chemical-Society — Location: NEW YORK(New York) (7.September.2003)

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  • Bailly, Christianorcid-logoUCLouvain
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  • Stephenne, VincentUCLouvain
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  • Daoust, DanielUCLouvain
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  • Godard, PierreUCLouvain
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  • Keunings, RolandUCLouvain
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Bailly, C., Stephenne, V., Daoust, D., Godard, P., Van Ruymbeke, E., & Keunings, R. (2003). New method to detect very low levels of long chain branching in high density polyethylene. American Chemical Society. Abstracts of Papers (at the National Meeting), 226, U387. https://hdl.handle.net/2078.5/141221 (Original work published 2003)