A New Analytical Model for the 2-terminal Mos Capacitor On Soi SubstrateFlandre, Denis;Vandewiele, F.(1988) IEEE Electron Device Letters — Vol. 9, n° 6, p. 296-299 (1988)
FilesNo attached file found for this publication.DetailsAuthorsFlandre, DenisAuthorVandewiele, F.AuthorAffiliationsUCLouvainShow moreCitations APA Chicago FWB Flandre, D., & Vandewiele, F. (1988). A New Analytical Model for the 2-terminal Mos Capacitor On Soi Substrate. IEEE Electron Device Letters, 9(6), 296-299. https://doi.org/10.1109/55.722 (Original work published 1988)