FilesDelcorte.pdf Restricted Access Adobe PDF12.65 MBRequest a copyDetailsAuthorsDelcorte, ArnaudUCLouvainauthorSupervisorsBertrand, PatrickAffiliationsUCLouvainFSA/MAPR - Département des sciences des matériaux et des procédésShow moreCitations APA Chicago FWB Delcorte, A. (1999). Static secondary ion mass spectrometry of thin organic layers. https://hdl.handle.net/2078.5/124419