Atomic force microscopy (AFM) (invited lecture)

Nysten, Bernard
(2002) Symposium on Microscopy and Topography — Location: Wépion, Belgium (16.May.2002)

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Nysten, B. (2002). Atomic force microscopy (AFM) (invited lecture). Symposium on Microscopy and Topography, Wépion, Belgium. https://hdl.handle.net/2078.5/117251