Nanometer scale patterning of thin metal films with a combined scanning tunneling / atomic force microscope

Langer, Luc;Nysten, Bernard;Bayot, Vincent;Issi, Jean-Paul
(1995) March Meeting of the American Physical Society — Location: San Jose, CA, USA (5.March.1995)

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Langer, L., Nysten, B., Bayot, V., & Issi, J.-P. (1995). Nanometer scale patterning of thin metal films with a combined scanning tunneling / atomic force microscope. March Meeting of the American Physical Society, San Jose, CA, USA. https://hdl.handle.net/2078.5/116848