VAMAS TWA2 interlaboratory comparison: Surface analysis of TiO2 nanoparticles using ToF-SIMS

Bennet, Francesca;Opitz, Robert;Ghoreishi, Narges;Plate, Kristina;Radnik, Jörg;et.al.
(2023) Journal of Vacuum Science & Technology A — Vol. 41, n° 5, p. 053210-053211 (2023)

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Authors
  • Bennet, Francescaorcid-logoFederal Institute for Risk Assessment, Max-Dohrn-Strasse 8-10, Berlin 10589, Germany; Federal Institute for Materials Research and Testing, Unter den Eichen 44-46, Berlin 12203, Germany
    Author
  • Opitz, Robertorcid-logoFederal Institute for Risk Assessment, Max-Dohrn-Strasse 8-10, Berlin 10589, Germany
    Author
  • Ghoreishi, Nargesorcid-logoFederal Institute for Risk Assessment, Max-Dohrn-Strasse 8-10, Berlin 10589, Germany
    Author
  • Plate, Kristinaorcid-logoFederal Institute for Risk Assessment, Max-Dohrn-Strasse 8-10, Berlin 10589, Germany
    Author
  • Delcorte, ArnaudUCLouvain
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  • Poleunis, Claudeorcid-logoUCLouvain
    Author
  • Radnik, Jörgorcid-logoFederal Institute for Materials Research and Testing, Unter den Eichen 44-46, Berlin 12203, Germany
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Abstract
Due to the extremely high specific surface area of nanoparticles and corresponding potential for adsorption, the results of surface analysis can be highly dependent on the history of the particles, particularly regarding sample preparation and storage. The sample preparation method has, therefore, the potential to have a significant influence on the results. This report describes an interlaboratory comparison (ILC) with the aim of assessing which sample preparation methods for ToF-SIMS analysis of nanoparticles provided the most intra- and interlaboratory consistency and the least amount of sample contamination. The BAM reference material BAM-P110 (TiO2 nanoparticles with a mean Feret diameter of 19 nm) was used as a sample representing typical nanoparticles. A total of 11 participants returned ToF-SIMS data, including in positive and negative polarity, using sample preparation methods of “stick-and-go” as well as optionally “drop-dry” and “spin-coat.” The results showed that the largest sources of variation within the entire data set were caused by adventitious hydrocarbon contamination or insufficient sample coverage, with the spin-coating protocol applied in this ILC showing a tendency toward insufficient sample coverage; the sample preparation method or the participant had a lesser influence on results.
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Bennet, F., Opitz, R., Ghoreishi, N., Plate, K., Barnes, J.-P., Bellew, A., Belu, A., Ceccone, G., de Vito, E., Delcorte, A., Franquet, A., Fumagalli, F., Gilliland, D., Jungnickel, H., Lee, T. G., Poleunis, C., Rading, D., Shon, H. K., Spampinato, V., et al. (2023). VAMAS TWA2 interlaboratory comparison: Surface analysis of TiO2 nanoparticles using ToF-SIMS. Journal of Vacuum Science & Technology A, 41(5), 053210-053211. https://doi.org/10.1116/6.0002814 (Original work published 2023)