Dynamic and noise behavior of short-gate FD SOI MOSFETs: numerical and experimental analysis
(2003) Conference on Electronic Devices - CDE 2003 — Location: Spain
Files
No attached file found for this publication.
Details
- Authors
- Affiliations
Citations
Rengel, R., Mateos, J., Pardo, D., Gonzalez, T., Martin, M. J., Dambrine, G., Danneville, F., & Raskin, J.-P. (2003). Dynamic and noise behavior of short-gate FD SOI MOSFETs: numerical and experimental analysis. Proceedings of the Conference on Electronic Devices - CDE 2003, pp. V-07-1 to V-07-4. https://hdl.handle.net/2078.5/229178