Influence of the applied current density on the growth stress evolution in anodic TiO2 filmsVanhumbeeck, J.-F.;Proost, Joris(2008) 59th Meeting of the International Society of Electrochemistry — Location: Sevilla, Spain (2008)
FilesNo attached file found for this publication.DetailsAuthorsVanhumbeeck, J.-F.AuthorProost, JorisUCLouvainAuthorAffiliationsUCLouvainFSA/MAPR - Département des sciences des matériaux et des procédésShow moreCitations APA Chicago FWB Vanhumbeeck, J.-F., & Proost, J. (2008). Influence of the applied current density on the growth stress evolution in anodic TiO2 films. Proceedings, p. 118. https://hdl.handle.net/2078.5/219872